Ключевые слова: HTS, Bi2223/Ag, tapes multifilamentary, ac losses, numerical analysis, experimental results
Kim H.J., Song K.J., Joo J.-H., Kim S.-W.(swkim@keri.re.kr), Hong J.-P.
Ключевые слова: measurement technique, HTS, tapes, ac losses, critical current, design, critical caracteristics
Ключевые слова: HTS, Bi2223, tapes, cables, current distribution, impedance, resistance, critical current, experimental results, power equipment, critical caracteristics
Ключевые слова: current leads, HTS, Bi2223, design parameters, cryocoolers, SMES, power equipment
Ключевые слова: LTS, NbTi, magnets, SMES, fabrication, test results, quench, inductance, power equipment
Iwasa Y., Lee H., Kim H.M.(homin@jokaku.mit.edu), Jankowski J.(joe@jokaku.mit.edu), Bascunan J., Fleshler S.(SFlesher@amsuper.com)
Ключевые слова: HTS, Bi2223/Ag, tapes, coils pancake, YBCO, coated conductors, stability, measurement technique, overheating, experimental results, temperature distribution, power equipment
Ключевые слова: FCL resistive, HTS, YBCO, films, meander, quench, experimental results, power equipment
Ключевые слова: FCL resistive, HTS, YBCO, films, quench, electric field distribution, voltage drops, experimental results, power equipment
Ключевые слова: FCL resistive, HTS, YBCO, films, meander, critical current, quench, experimental results, power equipment, critical caracteristics
Ключевые слова: HTS, REBCO, coated conductors, substrate Ni, Jc/B curves, pinning force, experimental results, critical caracteristics, magnetic properties
Sun J., Ji B.K., Jung C., Joo J., Park S., Jun B., Hong G., Kim C.(cjkim2@kaeri.re.kr), Kim H., Kim H., Park H.
Ключевые слова: coated conductors, substrate Ni, buffer layers, fabrication, MOCVD process, microstructure, HTS, YBCO, magnetic properties
Kim Y.(athens1147@yahoo.co.jp), Kim S.(shkim@nongae.gsnu.ac.kr), Kwag D.(kds3868@empal.com), Kim H.(hjkim@keri.re.kr)
Ключевые слова: HTS, cables, dielectric breakdown, insulation coating, test results, prototype, power equipment, magnetic properties
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, MOCVD process, substrate Ni, microstructure, fabrication, magnetic properties
Ji B.K., Jung C., Park S., Jun B., Hong G., Park H., Kim C., Sun J. ex-sun@kaeri.re.kr), Kim H.S.(hskim@cnu.ac.kr)
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni, SOE process, MOCVD process, microstructure, fabrication
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, substrate Ni, MOCVD process, microstructure, fabrication
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